THE USE OF AN ELECTRON BEAM ION TRAP (EBIT) TO MEASURE ELECTRON IMPACT
IONISATION CROSS-SECTIONS FOR HIGHLY CHARGED ARGON IONS.


E Sokell*, F J Currell, S Ohtani, H Shimizu and H Watanabe.


Cold Trapped Ions Project, ICORP, Japan Science and Technology
Corporation (JST), Tokyo 182-0024
Permanent address: Institute for Laser Science, University of
Electro-Communications, Chofu, Tokyo, Japan.
*Present Address: IRSAMC, Universite Paul Sabatier, 118 Route de
Narbonne, Toulouse, France.