THE USE OF AN ELECTRON BEAM ION TRAP (EBIT) TO MEASURE ELECTRON IMPACT IONISATION CROSS-SECTIONS FOR HIGHLY CHARGED ARGON IONS. E Sokell*, F J Currell, S Ohtani, H Shimizu and H Watanabe. Cold Trapped Ions Project, ICORP, Japan Science and Technology Corporation (JST), Tokyo 182-0024 Permanent address: Institute for Laser Science, University of Electro-Communications, Chofu, Tokyo, Japan. *Present Address: IRSAMC, Universite Paul Sabatier, 118 Route de Narbonne, Toulouse, France.