HIGH RESOLUTION PHOTOIONIZATION CROSS SECTIONS OF ARGON AND KRYPTON IN
THE VICINITY OF THE SUBVALENCE NS-THRESHOLD
S.Lauer*, H.Liebel*, F.Vollweiler*, R.M=FCller-Albrecht*, H.Steffes*,
H.Schmoranzer*, G.Reichardt#, V.L.Sukhorukov+, B.M.Lagutin+,
I.D.Petrov+, Ph.V.Demekhin+, K.-H.Schartner$, G.Mentzel$, O.Wilhelmi$
*Fachbereich Physik, Universit=E4t Kaiserslautern, D-67653 Kaiserslautern=
,
Germany
#BESSY, Lentzeallee 100, D-14195 Berlin, Germany
+Rostov State University of Transport Communications, RUS-344038
Rostov-on-Don, Russia
$I.Physikalisches Institut, Justus-Liebig-Universit=E4t Giessen, D-35392
Giessen, Germany
Photon-induced fluorescence spectroscopy (PIFS) was applied for a
high-resolution study of the absolute Ar 3s- and Kr 4s-electron
photoionization (PI) cross sections near their thresholds. The resonance
structures in the ns-PI cross sections were compared with the resonance
structures in the total PI cross sections. Theoretical results obtained
by using many-body perturbation theory (MBPT) with configuration
interaction (CI) techniques are presented.